Boin GmbH – Semiconductor Metrology Software

Boin GmbH – Semiconductor Metrology
Metrology software for the semiconductor industry. Boin GmbH develops
software solutions for the semiconductor industry and provides services such as
the development of complex mathematical algorithms.

WAFERMAP is an award winning software package used to collect, edit, analyze
and visualize measured physical parameters on semiconductor wafers. WAFERMAP can
import data files from various metrology tools such as ellipsometers, thickness
gauges and four point probes. The imported data can then be visualized or
printed as line scans, contour plots, 2D or 3D plots or as a histogram.

Boin GmbH
Haldenweg 25, 89160 Tomerdingen, Germany

Leave a Reply